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Equipment belonging to the NTC team: Nanoscope IIIa Multimode scanning probe microscope from Digital Instruments equipped with a Basic Extender electronics module, a signal access module and an environmental chamber. This microscope enables many modes derived from AFM among which we can quote electrical modes EFM (Electric Force Microscopy) and KFM (Kelvin Force Microscopy), nanolithography, MFM (Magnetic Force Microscopy) Nanoimprint Reactive Ion etching and Ion Beam Etching (...)